A Microscopic Mechanism of Low Temperature Helium Release

CL Gou,PX Wang,ZZ Fang,ZH Xia,DY Shen,XM Wang
DOI: https://doi.org/10.1088/1004-423x/6/10/009
1997-01-01
Abstract:He-4 ions of various energies and at various doses were implanted into three kinds of samples: TiH2 films, high purity Ti pieces as-received and after hydrogenation. Thermal release of helium was monitored in-situ by proton-enhanced backscattering. Low-temperature helium release was observed at T less than or equal to 573K. Single jump model was used to calculate the active energies for the release. Based on the observations, a mechanism of helium cluster-vacancy complex (HemVn-V-i) for low-temperature helium release is proposed.
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