A Coaxial Measurement System For Electromagnetic Parameters At Microwave Frequencies

Xing Liu,Xianyan Chen,Yuan Lin,Longfang Ye,Fen Xiao,Qinghuo Liu
DOI: https://doi.org/10.4028/www.scientific.net/AMR.881-883.1832
2014-01-01
Abstract:In this paper, an improved coaxial measurement system with a newly designed coaxial fixture is presented. The electromagnetic parameters of samples are retrieved from the scattering parameters measured by avector network analyzer (VNA) at microwave frequencies. The measurements of air and PTFE in the range of 1 similar to 6GHz were carried out to verify the reliability and the accuracy of this measurement system. By using frequency-sweep and data processing techniques, the multiplicity of roots is eliminated. The results show that this system can effectively be applied to measure the material electromagnetic parameters of absorbing materials with high accuracy in a wide frequency band.
What problem does this paper attempt to address?