Influence of Rapid Thermal Annealing on the Structure and Magnetic Properties of Cofe2o4 Films Prepared by Sol-Gel Method

Bin Zhu,Chengtao Yang,Quntiao Xie,Yalei Zhang,Ping Li
DOI: https://doi.org/10.1080/00150193.2012.743406
2013-01-01
Ferroelectrics
Abstract:CoFe2O4 thin films were prepared on the Si (001) substrates using the sol-gel method. In this study, the effects of annealing temperature, annealing time and annealing atmosphere on the structure and magnetic properties of CoFe2O4 films have been examined. X-ray diffraction analysis revealed that the films formed single spinel structures when the annealing temperature was above 450°C. The crystallization of the CFO thin films increased as the annealing temperature increased. Atomic force microscopy analysis showed that the film grain size increased with annealing temperature and that there was a single domain structure of critical size at 650°C. Vibrating sample magnetometer measurements showed that the saturation magnetization (Ms) reached a maximum and that the coercivity (Hc) varied with annealing conditions. When the CFO film was annealed at 650°C and 40 seconds, the ratio of O2:Ar was 1:1. The values for Ms and Hc had a maximum of 47.6 Am2.Kg−1 and a minimum of 86.8 KA.m−1, respectively.
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