Chemistry of post-annealing of epitaxial CoFe2O4 thin films

Anna-Karin Axelsson,Matjaz Valant,Laura Fenner,Andrew S. Wills,Neil McN Alford

DOI: https://doi.org/10.1016/j.tsf.2009.01.142

IF: 2.1

2009-01-01

Thin Solid Films

Abstract:CoFe2O4 thin films of different thicknesses were grown on SrTiO3 substrates. The X-ray diffraction analysis and atomic force microscopy indicated both epitaxy and a granular microstructure. We studied the magnetic properties of these films as a function of oxygen post-annealing and film thickness. All as-deposited films exhibited similar magnetic properties with saturated magnetization (Ms) of approximately 50% of the bulk Ms, (80 Am2 kg−1). After the post-annealing the Ms changes as a consequence of crystallographic restructuring of the film. Cation ordering in 100 nm thick films reduces Ms, whereas re-oxidation increases Ms for thinner films. 13 nm films, annealed for 1 h, reach the bulk Ms. For even thinner films the quantum-size effect reduces Ms. For a synthesis of ≥30 nm films an annealing cycle after deposition of every 15 nm layer is recommended.