Temperature-dependent optical properties of titanium oxide thin films studied by spectroscopic ellipsometry

Fan Zhang,Rongjun Zhang,Dongxu Zhang,Ziyi Wang,Jiping Xu,Yuxiang Zheng,Liangyao Chen,Renzhong Huang,Yan Sun,Xin Chen.,Xiangjian Meng,Ning Dai
DOI: https://doi.org/10.7567/APEX.6.121101
IF: 2.819
2013-01-01
Applied Physics Express
Abstract:The electron-beam evaporation method was devoted to fabricate anatase-phase TiO2 thin films on silicon substrate. The optical constants of the thin films determined by spectroscopic ellipsometry in the spectral range from 300 to 800 nm were studied in a temperature range from 293 to 533 K. The refractive indices decrease apparently with increasing temperature, and the thermal expansion and electron-phonon interaction can be introduced to elucidate this phenomenon. The absorption edge in extinction coefficient spectra shows a redshift at elevated temperature, which is attributed to thermally driven band gap shrinkage and electron lifetime loss of optical electron transition. (C) 2013 The Japan Society of Applied Physics
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