High Reliability Sensing Circuit for Deep Submicron Spin Transfer Torque Magnetic Random Access Memory

Wang Kang,Weisheng Zhao,J. -O. Klein,Youguang Zhang,C. Chappert,D. Ravelosona
DOI: https://doi.org/10.1049/el.2013.2319
2013-01-01
Electronics Letters
Abstract:A high reliability offset-tolerant sensing circuit is presented for deep submicron spin transfer torque magnetic tunnel junction (STT-MTJ) memory. This circuit, using a triple-stage sensing operation, is able to tolerate the increased process variations as technology scales down to the deep submicron nodes, thus improving significantly the sensing margin. Meanwhile, it clamps the bit-line voltage ...
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