Performance Degradation Simulation for M-type Cathode Based on Ion Bombardment

Xiaolian Shi,Hehong Fan,Fangfang Song,Xingqun Zhao,Suiren Wan,Xiaohan Sun
DOI: https://doi.org/10.1109/ivec.2013.6571103
2013-01-01
Abstract:Simulation of M-type cathode performance degradation is studied based on ion bombardment with interdiffusion effect considered. Sputtered volume, sputter distribution and ion spot occurrence time can be estimated, with estimated sputtered volume close to former researches. For M-type Re-coated cathode with 300nm-thick film, ion spots were estimated to appear after 2.06×10 5 h's working.
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