Comparison of Microwave Dielectric Properties of Ba 0.6 Sr 0.4 TiO 3 Thin Films Grown on (100) LaAlO 3 and (100) MgO Single-Crystal Substrates

Hui Wang,Yanlong Bian,Bo Shen,Jiwei Zhai
DOI: https://doi.org/10.1007/s11664-013-2489-z
IF: 2.1
2013-01-01
Journal of Electronic Materials
Abstract:The microwave properties of barium strontium titanate (Ba 0.6 Sr 0.4 TiO 3 ) thin films grown on (100) LaAlO 3 (LAO) and (100) MgO single-crystal substrates through the sol–gel technique were investigated. The interdigital capacitor (IDC) technique was used to measure the nonlinear dielectric properties in the frequency range from 1 GHz to 10 GHz. The results show that the Curie temperature, capacitance, and tunability of the films are strongly dependent upon the substrate. The film fabricated on the LaAlO 3 substrate has a higher tunability of 16.77% than that grown on the MgO substrate (∼8.38%), measured at 10 GHz with an applied voltage of 35 V. The loss tangent is a linear function of the frequency in the microwave range, and the film grown on the MgO substrate has a lower loss tangent than that grown on the LAO substrate. This work reveals the great potential of Ba 0.6 Sr 0.4 TiO 3 (BST) films for application in tunable microwave devices.
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