Multi-voltage threshold digitizer using a time-varied threshold for photon-counting X-ray security inspection imaging
Rui Chen,Chao Cai,Wei Liu,Daoming Xi,Qingguo Xie
DOI: https://doi.org/10.1016/j.nima.2022.167886
2023-01-01
Abstract:In this paper, we present a multi-voltage threshold (MVT) digitizer using a time-varied threshold and investigate the feasibility of using this digitizer to develop the data acquisition system for photon-counting X-ray security inspection imaging. This digitizer compares the scintillation pulse with a preset time-varied voltage signal and records the time information of the intersections. As the amplitude of the threshold varies as a function of time, the voltage values of the intersections could be calculated using the recorded time, and the energy information could be extracted via the acquired time-voltage samples. Unlike the constant voltage thresholds MVT digitizer requiring multiple voltage comparators, this method needs only one voltage comparator, which notably reduces the complexity in configuration. We demonstrate the development of such an MVT digitizer using a sine signal threshold and evaluate its energy performance with a yttrium orthosilicate (YSO) scintillator and Silicon Photomultiplier (SiPM) detector (designed for X-ray detection). The digitizer obtains energy resolutions of 41.4%, 26.6%, and 25.5% at 30, 59.5, and 80.9 keV, respectively. For comparison, the YSO/SiPM detector is also evaluated with a high-speed oscilloscope, and measured energy resolutions are 40.6%, 26.5%, and 25.1% at 30, 59.5, and 80.9 keV, respectively. These results indicate that the proposed MVT digitizer using a time-varied threshold is a promising method for developing a YSO/SiPM-based photon-counting X-ray detector.