Power Scaling And Beam Divergence Compression Of Bottom-Emitting Vertical-Cavity Surface-Emitting Lasers

Xing Zhang,Yongqiang Ning,Jianwei Zhang,Jinsheng Zhang,Peng Jia,Xiushan Li,Jingjing Shi,Li Qin,Yun Liu,Cunzhu Tong,Lijun Wang
DOI: https://doi.org/10.1117/12.2032046
2013-01-01
Abstract:Power scaling and beam divergence compression of 980 nm bottom-emitting vertical-cavity surface-emitting lasers (VCSELs) are presented in this paper. First, the relationships among the reflectivity of the n-doped distributed Bragg reflector, threshold current, and output power were analyzed, and the n-DBR reflectivity was optimized to achieve higher slope efficiency in a relatively low threshold current. Second, the influence of the p-contact on the current density distribution inside the active region was analyzed using the three-dimensional finite-element method. Uniform current distribution was achieved by optimizing the diameter of the p-contact, and a consequent improvement in beam divergence was observed. A low divergence of 5.4 degrees was obtained for a single device with continuous-wave (CW) of 1.46 W at room temperature. The 8x8 VCSEL array showed a divergence angle of 10.2 degrees at 4A. This array afforded a CW output power of 1.95 W under an injected current of 4 A and a pulse output power of 115 W under a pulse drive current of 130 A, a pulse width of 100 ns, and a repetition frequency of 100 Hz. VCSEL array chips were packaged in series to form a "quasi-array" to further increase the output power. This series achieved a peak output power of 475 W under a pulse drive current of 120 A.
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