Broadband Near-Infrared Emission from Bismuth-Doped Multilayer Films

Satoshi Morimoto,Minoru Fujii,Hong-Tao Sun,Yuji Miwa,Kenji Imakita,Jianrong Qiu,Shinji Hayashi
DOI: https://doi.org/10.1063/1.4757579
IF: 2.877
2012-01-01
Journal of Applied Physics
Abstract:Multilayer structures consisting of bismuth (Bi)-doped silica thin films and different kinds of spacer, i.e., Si, silica, Si-rich silica, layers are grown and the luminescence properties are studied. When samples were annealed at a low temperature, Bi-related near infrared active centers (BRACs) were formed at interfaces between Bi-doped silica and Si-rich silica (or silicon) due to the reduction of Bi3+ to BRACs by silicon. On the other hand, films annealed at a high temperature showed similar emission behaviors to bulk glasses. The results demonstrated here establish a new strategy for the control of BRACs and building peculiar Bi activated film structures.
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