Negative Capacitance Induced By Redistribution Of Oxygen Vacancies In The Fatigued Bifeo3-Based Thin Film

Qingqing Ke,Xiaojie Lou,Haibo Yang,Amit Kumar,Kaiyang Zeng,John Wang
DOI: https://doi.org/10.1063/1.4733982
IF: 4
2012-01-01
Applied Physics Letters
Abstract:The capacitance dispersion in La and Mg co-substituted BiFeO3 thin film has been studied at different stages of polarization switching. A negative capacitance (NC) behavior is observed in the sample that is fatigued above 10(9) switching cycles. The origin of the NC is investigated through analyzing relaxation processes and charge transport kinetics by admittance spectroscopy. An activation energy of similar to 0.6 eV and a zero field mobility mu(0) = 5.33 +/- 0.02 x 10(-13) m(2)/Vs are thus obtained. A physical mechanism is proposed to explain this behavior. It involves a redistribution of oxygen vacancies, which are trapped at the film/electrode interface during the fatigue process. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4733982]
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