Development of A Soft X-Ray Pulse Height Analyzer on the J-Text Tokamak

W. Jin,G. Zhuang,Y. H. Ding,Y. Zhang,J. Zhang
DOI: https://doi.org/10.1016/j.nima.2012.01.028
2012-01-01
Abstract:A soft X-ray pulse height analyzer has been designed and installed on the J-TEXT tokamak for measuring the electron temperature and possibly for monitoring the impurity content and concentration. A multi-channel analyzer, a set of amplifiers, and three silicon drift detectors constitute the detection system. An off-line analysis code was developed to analyze the raw data recorded by the system. The system can measure a minimum electron temperature of 400eV, and its routine operation provides electron temperature measurements at three different positions with a temporal resolution of 60ms and channel separation of 18cm. Line radiation from some moderate and high Z impurities are observable by the system. The results show that the intensity of line radiation from heavy impurity ions is inversely proportional to the plasma density under similar discharge conditions.
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