Joule heating effect on oxide whisker growth induced by current stressing in Cu/Sn-58Bi/Cu solder joint

Hongwen He,Liqiang Cao,Lixi Wan,Haiyan Zhao,Guangchen Xu,Fu Guo
DOI: https://doi.org/10.1007/s13391-012-2019-9
IF: 3.151
2012-01-01
Electronic Materials Letters
Abstract:The electromigration test was conducted in Cu/Sn-58Bi/Cu solder joint with high current density of 10 4 A/ cm 2 . Results showed that a large number of whiskers with natural weed appearance were observed at the cathode side in such a short current stressing time. Furthermore, some secondary whiskers were attached to the primary whiskers, which has never been reported before. We presumed the vapor-solid (VS) mechanism to explain the oxide whiskers growth, which was quite different from the traditional theory that the compressive stress took on the driving force. In conclusion, due to the over-Joule heating effect, the metal oxide whiskers were synthesized in bulk quantities by thermal evaporation of Sn oxide and Bi oxide.
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