Compact Modeling for Gate-All-around Nanowire Tunneling FETs (GAA NW-tFETs)

Zhiping Yu,Ling Li,Li Zhang,Jinyu Zhang
DOI: https://doi.org/10.1109/icsict.2012.6466744
2012-01-01
Abstract:A compact model for gate-all-around (GAA) nanowire tunneling FETs (NW-tFETs) is developed based on ballistic transport and charge balancing approaches. To account for the carrier injection to the channel from source/drain (S/D) regions for NW FETs, the density-of-states (DOS) charge, which results in the so-called quantum capacitance, is introduced and augmented to include tunneling phenomenon. A complete large-signal equivalent circuit is proposed for the first time, including the doping effects in S/D regions. Preliminary results from comparison of model prediction and numerical device simulation show the correctness of the modeling methodology.
What problem does this paper attempt to address?