Abstract:The Field Programmable Gate Array (FPGA) structure poses several constraints that make the implementation of complex asynchronous circuits such as Time–Mode (TM) circuits almost unfeasible. In particular, in Programmable Logic (PL) devices, such as FPGAs, the operation of the logic is usually synchronous with the system clock. However, it can happen that a very high–performance specifications demands to abandon this paradigm and to follow an asynchronous implementative solution. The main driver forcing the use of programmable logic solutions instead of tailored Application Specific Integrated Circuits (ASIC), best suiting an asynchronous design, is the request coming from the research community and industrial R&D of fast–prototyping at low Non Recursive Engineering (NRE) costs. For instance in the case of a high–resolved Time–to–Digital Converter (TDC), a signal clocked at some hundreds of MHz implemented in FPGA allows implementing a TDC with resolution at ns. If a higher resolution is required, the signal frequency cannot be increased further and one of the aces up the designer’s sleeve is the propagation delay of the logic in order to quantize the time intervals by means of a so-called Tapped Delay–Line (TDL). This implementation of TDL–based TDC in FPGAs requires special attention by the designer both in making the best use of all available resources and in foreseeing how signals propagate inside these devices. In this paper, we investigate the implementation of a high–performance TDL–TDC addressed to 28–nm 7–Series Xilinx FPGA, taking into account the comparison between different technological nodes from 65–nm to 20–nm. In this context, the term high–performance means extended dynamic–range (up to 10.3 s), high–resolution and single–shot precision (up to 366 fs and 12 ps r.m.s respectively), low differential and integral non–linearity (up to 250 fs and 2.5 ps respectively), and multi–channel capability (up to 16).

A high-resolution time-to-digital converter implemented in field-programmable-gate-arrays

A High Resolution Time-to-digital-convertor Based on a Carry-Chain and DSP48E1 Adders in a 28-Nm Field-Programmable-gate-array

A High-Resolution Tdc Implemented In A 90nm Process Fpga

A High-Throughput Vernier Time-to-Digital Converter on FPGAs with Improved Resolution Using a Bi-Time Interpolation Scheme

High-Resolution Time-to-Digital Converters Implemented on 40-, 28-, and 20-Nm FPGAs

A Low-Cost FPGA-Based Coarse-Fine Counting Time-to-Digital Converter With External High-Precision Reference Clock

High-Resolution, Multi-Channel FPGA-Based Time-to-Digital Converter

A Two-Step Time-to-Digital Converter with 5.6ps Resolution and 1 - 4255μs Measurement Range

A 3.9-ps RMS Precision Time-to-Digital Converter Using Ones-Counter Encoding Scheme in a Kintex-7 FPGA

Time-to-Digital Converter IP-Core for FPGA at State of the Art

A Design of High Resolution One-Clock-Cycle TDC Based on FPGA

A High-Resolution TDC Design Based on Multistep Fine Time Measurement by Utilizing Delay-Adjustable Looped Carry Chains on FPGAs

A 5.5 ps Time-interval RMS Precision Time-to-Digital Convertor Implemented in Intel Arria 10 FPGA

Carry chain based multi-channel time-to-digital converter

A Two-Stage Interpolation Time-to-Digital Converter Implemented in 20 and 28 N·m FGPAs

A 2ghz Programmable Counter with New Re-Loadable D Flip-Flop

A 1.15-Ps Bin Size and 3.5-Ps Single-Shot Precision Time-to-Digital Converter with On-Board Offset Correction in an FPGA

A 20-Ps Time-to-Digital Converter (TDC) Implemented in Field-Programmable Gate Array (FPGA) with Automatic Temperature Correction

A 19 ps Precision and 170 M Samples/s Time-to-Digital Converter Implemented in FPGA with Online Calibration

Design of a high-precision time-to-digital converter in an Elitestek Ti60 field-programmable-gate-array

High-Performance Time-to-Digital Conversion on a 16-nm Ultrascale+ FPGA