Test pattern generation for column compression multiplier

Pingying Zeng,Zhigang Mao,Yizheng Ye,Yuliang Deng
DOI: https://doi.org/10.1109/ATS.1998.741663
1998-01-01
Abstract:When used as the building cell of a parallel multiplier, the (4,2) counter tree is better suited than a Wallace tree for a VLSI implementation because of its more regular structure. In this paper test pattern generation for the CC multipliers is presented following a brief introduction to the structure of the (4,2) counter and the column compression multiplier using a (4,2) counter as its building cell. In conclusion, less test patterns are enough to exhaustively test the CC multiplier
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