An Efficient Method For Testing Multipliers Of Embedded Dsps In Fpga

Zhiqian Zhang,Jinmei Lai
DOI: https://doi.org/10.1109/ICSICT.2016.7999014
2016-01-01
Abstract:This paper presents an efficient method to generate BIST scheme for multipliers of embedded DSPs in an FPGA. It not only can be applied to those multipliers consisting of half adders and full adders but also some complex multiplier circuits with other compressors. This approach provides an easy way to generate test set for target multipliers. We apply our method to different multipliers with different input bit-widths, coding circuits and compress circuits and achieve high fault coverage with a small number of test configurations. It only needs 2(13) test vectors to test a 18x18 Booth2 multiplier with complex Wallace tree structure and reaches fault coverage greater than 99%.
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