Radiation Tolerance of Cu/W Multilayered Nanocomposites

Yuan Gao,Tengfei Yang,Jianming Xue,Sha Yan,Shengqiang Zhou,Yugang Wang,Dixon T. K. Kwok,Paul K. Chu,Yanwen Zhang
DOI: https://doi.org/10.1016/j.jnucmat.2011.03.030
IF: 3.555
2011-01-01
Journal of Nuclear Materials
Abstract:Magnetron sputtered Cu/W multilayer samples with individual layer thicknesses from 2.5 to 50nm were irradiated by 50keV He+ ions at ion fluences from 7×1020 to 6×1021m−2 at room temperature. Evolution of the interfacial structure during irradiation is monitored by X-ray diffraction and cross-sectional transmission electron microscopy. Moreover, radiation responses on the individual layer thickness and He+ ion irradiation fluence are revealed. The highly morphological stability of the multilayered structure suggests that the interfacial structure and grain boundary can serve as sinks for radiation-induced defects.
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