Inverse Function Analysis Method for Fringe Pattern Profilometry

Yingsong Hu,Jiangtao Xi,Joe F. Chicharo,Wenqing Cheng,Zongkai Yang
DOI: https://doi.org/10.1109/TIM.2009.2022382
IF: 5.6
2009-01-01
IEEE Transactions on Instrumentation and Measurement
Abstract:In this paper, we present a mathematical model that describes a general relationship between the projected signal and the deformed signal in fringe pattern profilometry (FPP) systems. The derived mathematical model proves that in theory any kind of fringe pattern could be utilized for profilometry. Based on the derived mathematical model, this paper also proposes a new algorithm, referred to as in...
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