Subgap leakage and interface states in superconductor–insulator–superconductor tunnel junctions

Hyunsik Im,Yu.A. Pashkin,Yongmin Kim,T.F. Li,Kyooho Jung,O. Astafiev,J.S. Tsai
DOI: https://doi.org/10.1016/j.physc.2010.02.012
2010-01-01
Abstract:We use tunneling spectroscopy in Al and Nb based superconductor-insulator-superconductor (SIS) junctions to demonstrate the existence of metallic quasiparticle states at the interface of a superconducting electrode and an oxide layer, introducing a new method to directly evaluate the interface quasiparticle areal density of states. Current-voltage (I-V) characteristics typically observed in metal-insulator-superconductor (MIS) junctions are observed in the subgap voltage region. The turn-on voltage of the MIS-type leakage is found to be determined by the superconducting electrode with a smaller gap energy (Delta), and its magnitude depends on the nature of the interface. Our experiment suggests that the interface plays a key role in contributing to the subgap leakage influencing the performance of superconducting circuits. (C) 2010 Elsevier By. All rights reserved.
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