Quality improvement of ZnTe crystals by annealing in In and Zn vapor
Lingli Wei,Changbao Huang,Youbao Ni,Haixin Wu,Zhenyou Wang,Xuezhou Yu,Qianqian Hu,Guojin Liu,Qiang Zhou
DOI: https://doi.org/10.1016/j.jcrysgro.2024.127604
IF: 1.8
2024-02-02
Journal of Crystal Growth
Abstract:In this paper, a large-size and crack-free ZnTe single crystal 40 mm in diameter and 110 mm in length was grown in a two-zone vertical furnace by the modified Bridgman method. To reduce the defect concentration and improve the resistivity of ZnTe crystals for satisfying the requirements in terahertz applications, we investigated an effective thermal annealing process with the first step in Zn vapor at 950 °C for 240 h and the second step in In and Zn vapor at 1050/950 °C(ZnTe/In and Zn) for 120 h. The inductively coupled plasma mass spectrometer (ICP-MS) analysis indicates that the concentration of indium in the annealed crystals is about 4.85 × 10 18 cm −3 . Compared with the ZnTe crystals annealed in Zn vapor, the X-ray rocking curve (XRC) show that ZnTe crystals annealed in In and Zn vapor still have high crystallization quality. Additionally, the resistivity is enhanced by 5–6 orders to 10 9 Ω cm while preserving the high infrared (IR) transmittance with about 65 % in the region from 2.5 to 20 μm. The terahertz (THz) transmission spectra of the annealed crystals show higher amplitude, and the maximum transmission is approximately 70 % at the range of 0.5–2 THz, which is 40 % more than the ZnTe crystals annealed in Zn vapor in the low-frequency region.
materials science, multidisciplinary,physics, applied,crystallography