The most powerful tool for the structural analysis of tungsten suboxide nanowires: Raman spectroscopy

Dong Yu Lu,Jian Chen,Shao Zhi Deng,Ning Sheng Xu,Wei Hong Zhang
DOI: https://doi.org/10.1557/JMR.2008.0056
IF: 2.7
2008-01-01
Journal of Materials Research
Abstract:Crystalline tungsten suboxide nanowires were grown on silicon substrates by thermal evaporation of tungsten powder in a flow of argon gas without any catalyst. With different growth temperatures, two kinds of tungsten suboxide nanowires (W 18 O 49 and W 20 O 58 ) were obtained. The structures, morphologies, and compositions of these two nanowires were characterized by scanning electron microscopy (SEM), electron probe microanalyzer (EPMA), x-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), x-ray photoelectron spectroscopy (XPS), and Raman techniques. The results show that XRD and TEM are not good characterization techniques for identifying W 18 O 49 and W 20 O 58 nanowires; however, Raman spectroscopy (RS) is a powerful tool to distinguish the difference between them. This is due to the notable molecular bond contributing to the vibrational frequency.
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