Influence of Thermal Cycling on the Microstructure and Shear Strength of Sn3.5ag0.75cu and Sn63pb37 Solder Joints on Au/Ni Metallization

Hongtao Chen,Chunqing Wang,Mingyu Li,Dewen Tian
2007-01-01
Abstract:The influence of thermal cycling on the microstructure and joint strength of Sn3.5Ag0.75Cu (SAC) and Sn63Pb37 (SnPb) solder joints was investigated. SAC and SnPb solder balls were soldered on 0.1 and 0.9 mu m Au finished metallization, respectively. After 1000 thermal cycles between -40 degrees C and 125 degrees C, a very thin intermetallic compound (IMC) layer containing Au, Sn, Ni, and Cu formed at the interface between SAC solder joints and underneath metallization with 0.1 mu m Au finish, and (Au, Ni, Cu)Sn-4 and a very thin Au-Sn-Ni-Cu IMC layer formed between SAC solder joints and underneath metallization with 0.9 P mu m Au finish. For SnPb solder joints with 0.1 mu m Au finish, a thin (Ni, Cu, Au)(3)Sn-4 IMC layer and a Pb-rich layer formed below and above the (Au, Ni)Sn-4 IMC, respectively. Cu diffused through Ni layer and was involved into the IMC formation process. Similar interfacial microstructure was also found for SnPb solder joints with 0.9 mu m Au finish. The results of shear test show that the shear strength of SAC solder joints is consistently higher than that of SnPb eutectic solder joints during thermal cycling.
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