Optimizing the Growth of Cosi2 Film with Oxide-Mediated Cosi2 Template by Silicon Cap Layer

M. Xu,A. Vantomme,D. Smeets,K. Vanormelingen,S. D. Yao
DOI: https://doi.org/10.1016/j.jcrysgro.2009.06.049
IF: 1.8
2009-01-01
Journal of Crystal Growth
Abstract:Applying both template and Si cap technology, we achieved the epitaxial growth of CoSi2 directly on Si(100) substrate by rapid thermal annealing (RTA). The crystal quality of CoSi2 film is found to be significantly dependent on the Si cap thickness. In our work, a good-quality CoSi2 film with a minimum of χmin~11.6% and 3.3Ω/square was obtained as a 15nm Co with a subsequent 15nm Si cap layer is deposited on an oxide-mediated CoSi2 template and followed by an anneal at 1050°C under N2 protection; whereas too thin or thick Si cap layer will deteriorate the crystalline quality of CoSi2. These experimental results are discussed in combination with the simulation of Rutherford backscattering spectroscopy and X-ray reflectivity.
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