Epitaxial-Growth Of Cosi2 On Both (111) Si And (100) Si Substrates By Multistep Annealing Of A Ternary Co/Ti/Si System
ping liu,bingzong li,zhen sun,zhiguang gu,weining huang,zuyao zhou,rushan ni,chenglu lin,shichang zou,feng hong,g a rozgonyi
DOI: https://doi.org/10.1063/1.354824
IF: 2.877
1993-01-01
Journal of Applied Physics
Abstract:Formation of CoSi2 films by the reaction of ternary Co/Ti/Si system has been investigated. Ti and Co films were sequentially deposited on Si substrates by ion beam sputtering. It succeeded in the growth of epitaxial single-crystalline COSi2 films on both Si(111) and Si(100) substrates through a multistep annealing process with temperatures from 550 to 900-degrees-C in a nitrogen environment. A thin layer of TiN was formed on top of the epitaxial CoSi2. The values of Rutherford backscattering spectrometry/channeling minimum yield chi(min) for the epitaxial CoSi2 films were in the range of 10%-14%. The epitaxial CoSi2 grown on Si(111) was found to be composed of type B.