Health Assessment Method for Core Components of Switching Quantity Interface Circuit Based on Active Excitation Test
Peiyang Xu,Long Jia,Jian Ma,Chang Chen,Wei Chen,Chunyun Lan,Xinyu Zou,Tianhao Li
DOI: https://doi.org/10.1109/icrms59672.2023.00093
2023-01-01
Abstract:As power electronics technology continues to advance, the prevalence of switching quantity interface circuits has grown in diverse domains, encompassing industrial production and everyday civilian applications. An analysis of operational data from these circuits, along with an assessment of their overall health, proves instrumental in the timely detection and resolution of operational anomalies. This holds paramount significance in upholding the reliability of these interface circuits. Nevertheless, tracking the degradation trajectory of the core components during their operational lifespan poses a challenge. Typically, only two states, normal and abnormal, are readily discernible, making direct health assessment elusive. To address this issue, this study introduces a health assessment methodology for the fundamental components of switch quantity interface circuits based on active excitation testing. Through the application of active excitation, the performance decay profile of the optical coupler is ascertained, solving the problem of capturing the degradation process within these circuits. This approach facilitates the stable and precise characterization of the health status of switching quantity interface circuits. The health assessment method presented in this paper is characterized by modest computational resource demands and a reduced reliance on expert knowledge. It is adept at quantitatively delineating the health status of switch-quantity interface circuits with precision, thereby offering guidance for the maintenance and replacement of pivotal electronic components within these circuits. In doing so, it contributes to the assurance of operational dependability and an extension of the service life of switch quantity interface circuits.