Transmission electron microscopy study of the microstructure of B19 martensite in sputter-deposited Ti50.2Ni30Cu19.8 thin films

X.L. Meng,M. Sato,A. Ishida
DOI: https://doi.org/10.1016/j.scriptamat.2008.04.023
IF: 6.302
2008-01-01
Scripta Materialia
Abstract:The martensite structures in Ti50.2Ni30Cu19.8 thin films were studied by transmission electron microscopy. The single-pair martensite morphologies with (011) or (111) twins are usually observed. (111) type I twins are dominant in the film annealed at 773 K, whereas (011) compound twins are dominant in that annealed at 973 K. The (011) twin width decreases dramatically when the annealing temperature changes from 773 to 973 K. The grain boundary precipitates in the films annealed at 973 K are responsible for these changes. (C) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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