Effect of changing incident wavelength on Raman features of optical phonons in SiC nanorods and TaC nanowires

Yan Yan,Shu-Lin Zhang,Shoushan Fan,Weiqiang Han,Guomen Meng,Lide Zhang
DOI: https://doi.org/10.1016/S0038-1098(03)00236-9
IF: 1.934
2003-01-01
Solid State Communications
Abstract:Novel Raman scattering in polar semiconductor SiC and TaC one-dimensional materials have been carried out. With increasing incident laser wavelength from 488 to 633 nm there is a huge difference in Raman intensity enhancement for the LO/IF peaks and the TO peak. This has been interpreted as due to Fröhlich interaction and abundant defects in polar nano-scale semiconductor materials.
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