Design of inspection system for TFT-LCD surface defects under complex background

Zhu Guang,Zhu Xuefang,Zhang Huakun
2011-01-01
JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT
Abstract:Background removal and flaw region detect algorithm are designed for processing the TFT-LCD images under the condition of complex background and low contrast.In this paper,one-dimensional Fourier transform and full-size characteristics of wavelet transform to extract the flaw information are used to detect the flaw region accurately.The online detect platform is built to capture the images with help of illuminants and high-speed line-scan camera,then the images are saved in computer by image acquisition card.The image-processing software is coded by Matlab.The experiment analysis for the test result under different illuminant condition shows that the system can accurately detect the flaw region of TFT-LCD panel surface.The identification rate is greater than 96% and the scanning time interval is less than 80μs which meets the requirements of real-time.
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