Abstract:Textile Research Journal, Ahead of Print. Aiming at the existing fabric defect detection algorithms with their suboptimal detection accuracy, high model complexity, difficult deployment to the edge of the device, and insufficient ability to meet the problem of real-time detection of fabric defects, we propose a lightweight fabric defect detection model (LWFDD-YOLO) based on the improved YOLOv8n. First, a generalized efficient layer attention network with selective kernel attention (GELAN_SKA) is proposed to replace the C2f module, and selective kernel attention is added to the module to adjust the weights of the convolution kernel according to the different features of different scales, reduce the use of computational resources, thus improving the model's detection performance and efficiency. Second, a cascaded group attention (CGA) mechanism is added to provide a different input segmentation for each head to enhance the feature diversity of the input attention heads and improve the model's computational efficiency. An ultra-lightweight dynamic up-sampling operator (Dy_sample) is introduced, which employs a point-sampling-based approach to reduce the consumption of computational resources and improve model performance. Finally, the YOLOv8l framework is utilized to construct a complex model teacher network and the features learned from the teacher network are transferred to the lightweight network proposed in this paper, thus further improving the model performance of the algorithm. The experimental results show that on the self-built fabric defect dataset, the accuracy, recall, and mean average precision (mAP) of our algorithm reach 89.4%, 85.2%, and 87.9%, which are 8.9%, 7.2%, and 4.5% higher than the original model, respectively, the number of parameters of the model decreases by 23.4%, the amount of GFLOPs decreases by 25.6%, and the file size is only 9.2 MB. The detection speed can reach 163.4 FPS on GPU. On the AliCloud Tian Chi dataset, the accuracy, recall, and mAP were also improved by 7.4%, 2%, and 4.4%, respectively. The LWFDD-YOLO algorithm proposed in this study can realize real-time detection of fabric defects with relatively obvious improvement in accuracy, and the model requires less memory and is easier to deploy to edge devices, so can be used as a reference for real-time detection of fabric defects.

A Small-scale Object Detection Method for LCD Defects Based on Improved YOLOv8

Small-scale defect detection in industrial environment based on lightweight deep learning network

LIDD-YOLO: A Lightweight Industrial Defect Detection Network

TFT‐LCD mura defect visual inspection method in multiple backgrounds

PCB Board Defect Detection Method based on Improved YOLOv8

PCB Defect Detection Algorithm Based on Improved YOLOv8

LWFDD-YOLO: a lightweight defect detection algorithm based on improved YOLOv8

A lightweight model for digital printing fabric defect detection based on YOLOX

A Novel YOLOv5_ES based on lightweight small object detection head for PCB surface defect detection

Small object detection method with shallow feature fusion network for chip surface defect detection

An Efficient Tiny Defect Detection Method for PCB With Improved YOLO Through a Compression Training Strategy

An Effective Defect Inspection Method for LCD Using Active Contour Model

Defect detection in automotive glass based on modified YOLOv5 with multi-scale feature fusion and dual lightweight strategy

A real-time and efficient surface defect detection method based on YOLOv4

Accurate segmentation of small targets for LCD defects using deep convolutional neural networks

LAYN: Lightweight Multi-Scale Attention YOLOv8 Network for Small Object Detection

LW-YOLO: Lightweight Deep Learning Model for Fast and Precise Defect Detection in Printed Circuit Boards

Automotive adhesive defect detection based on improved YOLOv8

A Lightweight Detection Algorithm for Surface Defects in Small-Sized Bearings

A Lightweight Detector Based on Attention Mechanism for Fabric Defect Detection

Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector