A real-time and efficient surface defect detection method based on YOLOv4

Jiansheng Liu,Guolong Cui,Chengdi Xiao
DOI: https://doi.org/10.1007/s11554-023-01333-4
IF: 2.293
2023-06-26
Journal of Real-Time Image Processing
Abstract:In this paper, we propose a lightweight and fast detection framework called Mixed YOLOv4-LITE series based on You Only Look Once (YOLOv4) for industrial defect detection. To reduce the size of the model and achieve a better balance between accuracy and speed, MobileNet series (MobileNetv1, MobileNetv2, MobileNetv3) and depthwise separable convolutions are employed in the modified network architecture to replace the backbone network CSPdarknet53 and traditional convolution in the neck and head of YOLOv4, respectively. Additionally, we combine the Mosic data enhancement method to enrich the dataset. To accelerate the convergence of the network, transfer learning is used in the training stage, in which pseudo-convergence is precluded as much as possible by adjusting the learning rate of the cosine annealing scheduler. Finally, we evaluate the proposed methods on both public defect datasets, NEU-DET and PCB-DET, with different types and scales. On NEU-DET, Mixed YOLOv4-LITEv1 achieved an improvement of 214% in detection speed while maintaining accuracy, detecting at a rate of 88 FPS on a single GPU. Meanwhile, Mixed YOLOv4-LITEv1 realizes an outstanding maximum improvement of 200% in detection speed while only losing a mean average precision (mAP) value of 1.77% on PCB-DET. Furthermore, the sizes of our proposed series models are only about one-fifth of the original YOLOv4 model. The extensive test results indicate that our work can provide an efficient scheme with low deployment cost for surface defect detection at different scales in multiple scenarios, meeting the needs of practical industrial applications.
computer science, artificial intelligence,engineering, electrical & electronic,imaging science & photographic technology
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