Abstract:Verification of hardware design code is crucial for the quality assurance of hardware products. Being an indispensable part of verification, localizing bugs in the hardware design code is significant for hardware development but is often regarded as a notoriously difficult and time-consuming task. Thus, automated bug localization techniques that could assist manual debugging have attracted much attention in the hardware community. However, existing approaches are hampered by the challenge of achieving both demanding bug localization accuracy and facile automation in a single method. Simulation-based methods are fully automated but have limited localization accuracy, slice-based techniques can only give an approximate range of the presence of bugs, and spectrum-based techniques can also only yield a reference value for the likelihood that a statement is buggy. Furthermore, formula-based bug localization techniques suffer from the complexity of combinatorial explosion for automated application in industrial large-scale hardware designs. In this work, we propose Kummel, a K nowledge-a u g m ented m utation-bas e d bug loca l ization for hardware design code to address these limitations. Kummel achieves the unity of precise bug localization and full automation by utilizing the knowledge augmentation through mutation analysis. To evaluate the effectiveness of Kummel, we conduct large-scale experiments on 76 versions of 17 hardware projects by seven state-of-the-art bug localization techniques. The experimental results clearly show that Kummel is statistically more effective than baselines, e.g., our approach can improve the seven original methods by 64.48% on average under the RImp metric. It brings fresh insights of hardware bug localization to the community.

Mutation-based diagnostic test generation for hardware design error diagnosis

Improving Defect Detection Ability of Derived Test Cases Based on Mutated UML Activity Diagrams

Mantra: Mutation Testing of Hardware Design Code Based on Real Bugs.

An improved method for test chip design

Functional Testbench Qualification by Mutation Analysis

Mutation-analysis Driven Functional Verification of a Soft Microprocessor.

Knowledge-Augmented Mutation-Based Bug Localization for Hardware Design Code

HDL-Mutation Based Simulation Data Generation by Propagation Guided Search

Automatic Debugging of Operator Errors Based on Efficient Mutation Analysis

Mutation-Based Simulation Test Data Generation for Testing Complex Real-Time Software

An Efficient Diagnostic Test Pattern Generation Framework

An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

Binary Mutation Testing Through Dynamic Translation

Test Case Generation using Mutation Operators and Fault Classification

Hardware Fault Injection Tool Based on JTAG

Mutation Testing: Principal, Optimization and Application

An Automated Fault Injection Technique Based On Vhdl Syntax Analysis And Stratified Sampling

SN4KE: Practical Mutation Testing at Binary Level

A scan chain optimization method for diagnosis

Specification-Driven Conformance Checking for Virtual/Silicon Devices Using Mutation Testing

An Algorithm for Fault Diagnosis Based on Combinatorial Design Approach for Testing