WITHDRAWN: Simulation of retention characteristics for Si-nanocrystal nonvolatile memory

Yingtao Li,Su Liu
DOI: https://doi.org/10.1016/j.microrel.2009.06.002
IF: 1.6
2009-01-01
Microelectronics Reliability
Abstract:This article has been withdrawn at the request of the author(s) and/or editor. The Publisher apologizes for any inconvenience this may cause. The full Elsevier Policy on Article Withdrawal can be found at http://www.elsevier.com/locate/withdrawalpolicy .
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