Deposition and characterization of PANI/SSA films by MAPLE technology

WANG Wei,LI ChengXiang,SHENG LiuSi
DOI: https://doi.org/10.1360/972011-715
2011-01-01
Chinese Science Bulletin
Abstract:We deposited PANI/SSA thin films by MAPLE technology using a KrF excimer laser and characterized the films by FTIR,UV-vis,XPS and XRD.We found that under the protection of the matrix the characteristic structures of PANI were effectively protected.The molecular chain and the structures related to doping changed.The results also showed that the PANI/SSA films are in a crystalline state.
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