Evolution of Shear Banding in Fully Dense Nanocrystalline Ni Sheet

Rongtao Zhu,Jianqiu Zhou,Hua Jiang,Dongsheng Zhang
DOI: https://doi.org/10.1016/j.mechmat.2012.01.008
IF: 4.137
2012-01-01
Mechanics of Materials
Abstract:Evolution of shear banding in fully dense electrodeposited nanocrystalline Ni was successfully monitored by using a digital image correlation technique under a quasi-static uniaxial tensile load. To investigate the microscopic physical mechanism of the shear banding, in-situ tensile testing for the nanocrystalline Ni sample was conducted in a transmission electron microscope and fracture surface of the sample was examined by field emission scanning electron microscope. The results suggest that grain boundary migration based on atomic diffusion is a main carrier of the shear banding.
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