Research on the Method of Interferometric-Spatial-Phase for the Alignment of Lithography

Ma Ping,Hu Song,Zhou Shaolin,Xu Wenxiang
DOI: https://doi.org/10.3969/j.issn.1671-4776.2010.10.010
2010-01-01
Abstract:A new nanoscale alignment approach for the high resolution proximity-contact lithography is introduced.The basic principle of the method was introduced briefly,the design of optical structure was discussed,and the vertical design for the optical path of illuminance and capture for interference fringes were put forward.The monochrome unexposure source,the telecentric light mode and the structure design of the optical path compensator were adopted.In terms of the software disposal,it was proposed that the CCD subdivision by nine dots and four lines curve fitting area-scan and the localization by least squares curve simulation were adopted to improve the alignment accuracy of the lithography.The method can overcome many shortcomings of existing alignment methods with the nanoscale accuracy,and can satisfy the alignment need of the nanoscale lithography.
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