Research on welding fault during LED chips packaging

YU Da-hai,WEN Yu-mei,LI Ping,CAI You-hai
DOI: https://doi.org/10.13873/j.1000-97872009.10.012
2009-01-01
Abstract:Frequent welding faults and their harm during LED chips packaging are introduced.A typical blot welding fault of LED chips is studied,and its contact resistance and tunneling resistance are analyzed.The spectral characteristic and photocurrent of LED chips at the normal and fault welding are measured.The opto-electronic equivalent circuit of welding fault LED is proposed,and the experimental result is analyzed by the circuit.The experimental result shows that the light intensity and photocurrent of the welding fault LED chips are much less than that of the normal ones.It can detect the welding fault of LED chips by measuring the light intensity or photocurrent of LED chips.The research is important for improving the reliability of LED packaging and proposing the method of detecting welding faults during LED packaging.
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