On-Chip Coupled Transmission Line Modeling for Millimeter-Wave Applications Using Four-Port Measurements

Kai Kang,James Brinkhoff,Jinglin Shi,Fujiang Lin
DOI: https://doi.org/10.1109/tadvp.2009.2024212
2010-01-01
IEEE Transactions on Advanced Packaging
Abstract:Transmission lines are fundamental elements in millimeter-wave circuits. In this paper, on-chip coupled transmission lines, fabricated in a commercial 0.18 complementary metal-oxide semiconductor process, have been modeled, based on measured 50 GHz four-port scattering-parameters. The two-port open-short deembedding technique and thru deembedding method were successfully extended and applied to the four-port structures presented here. The accuracy of the deembedding techniques was verified by full-wave electromagnetic simulation. Based on the deembedded S-parameters, a SPICE-compatible equivalent circuit model of on-chip coupled transmission lines was extracted. Simulation and measurement results agree well over the entire frequency band from 100 MHz up to 50 GHz.
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