A-B Plane Dielectric Discussion on Layered Multiferroic Oxides

Yalin Lu,R. J. Knize
DOI: https://doi.org/10.2529/piers090908175250
2010-01-01
PIERS Online
Abstract:With a goal to investigate possible anisotropic dielectric properties in layered multiferroic oxides, infrared reflection measurement was used to measure dielectric constants inside the a-b lane of highly c-oriented double layered Bi2FeCrO6 thin film, and the results were compared to that from highly c-oriented BiFeO3 thin film. The dielectric spectra were identified according to optical phonons, and the areas with negative permittivity were analyzed. The preliminary effort will actually lead to a very interesting area of finding new photonic materials for efficiently controlling EM waves.
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