Domain Structure and In-Plane Switching in a Highly Strained Bi0.9Sm0.1FeO3 Film

Weigang Chen,Wei Ren,Lu You,Yurong Yang,Zuhuang Chen,Yajun Qi,Xi Zou,Junling Wang,Thirumany Sritharan,Ping Yang,L. Bellaiche,Lang Chen
DOI: https://doi.org/10.1063/1.3664394
IF: 4
2011-01-01
Applied Physics Letters
Abstract:We report the domain structure and ferroelectric properties of a 32 nm-thick Bi0.9Sm0.1FeO3 film epitaxially grown on a LaAlO3 (LAO) substrate. This film exhibits a monoclinic Mc phase, with its monoclinic distortion and anisotropy of in-plane (IP) lattice parameters being both smaller than those of pure BiFeO3 (BFO) grown on LaAlO3. Polarization hysteresis loops measured using a quasi-planar capacitor show an in-plane polarization up to 30 mu C/cm(2). Piezoresponse force microcopy demonstrates that a 180 degrees in-plane polarization switching accompanied by a 90 degrees domain wall rotation takes place after electric poling. First-principles calculations suggest the differences between highly strained Sm-substituted and pure BiFeO3. (C) 2011 American Institute of Physics. [doi:10.1063/1.3664394]
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