The Power Effect in Write-In Process of Ag-Tcnq Electric Recording Thin Film

XG Wan,J Li,DY Chen,YM Jiang,ZY Hua
DOI: https://doi.org/10.1002/1521-396x(200010)181:2<r13::aid-pssa999913>3.0.co;2-e
2000-01-01
Abstract:physica status solidi (a)Volume 181, Issue 2 p. R13-R15 Rapid Research Note The Power Effect in Write-in Process of Ag-TCNQ Electric Recording Thin Film Xinggong Wan, Xinggong Wan [email protected] Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this authorJin Li, Jin Li Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this authorDianyong Chen, Dianyong Chen Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this authorYiming Jiang, Yiming Jiang Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this authorZhongyi Hua, Zhongyi Hua Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this author Xinggong Wan, Xinggong Wan [email protected] Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this authorJin Li, Jin Li Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this authorDianyong Chen, Dianyong Chen Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this authorYiming Jiang, Yiming Jiang Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this authorZhongyi Hua, Zhongyi Hua Vacuum Physics Laboratory, Fudan University, 200433 Shanghai, P.R. ChinaSearch for more papers by this author First published: 26 October 2000 https://doi.org/10.1002/1521-396X(200010)181:23.0.CO;2-ECitations: 9AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References [1] R.S. Potember, T.O. Poehler, and D.O. Cowan, Appl. Phys. Lett. 34 405 (1979). [2] R.S. Potember, T.O. Poehler, and R.C. Benson, Appl. Phys. Lett. 41 548 (1982). [3] C. Sato, S. Wakamatsu, K. Tadokoro, and K. Ishii, J. Appl. Phys. 68 6535 (1990). [4] J.J. Hoagland, X.D. Wang, and K.W. Hipps, Chem. Mater. 5 54 (1992). [5] L. Shield, J. Amer. Chem. Soc., Faraday Trans. 81 2 (1985). [6] T. Watarai and S. Datta, NEC Tech. J. 52 31 (1999). [7] C.A. Wialrowski and Ch.H. House, Logic Circuits and Microcomputer, McGraw-Hill, Inc., New York 1980. [8] C. Joachim and J.P. Launay, J. Mol. Electron. 6 37 (1990). [9] M.P. Samanta, W. Tian, S. Datta, J.L. Henderson, and C.P. Kubiak, Phys. Rev. B 53 R7626 (1996). Citing Literature Volume181, Issue2October 2000Pages R13-R15 ReferencesRelatedInformation
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