Dielectric Strength and Statistical Property of Single and Multiple-Break Vacuum Circuit Breakers

LIAO Min-fu,ZOU Ji-bin,DUAN Xiong-ying,SUN Hui
DOI: https://doi.org/10.3321/j.issn:1000-3673.2006.05.002
2006-01-01
Abstract:Based on the analysis on breakdown property of vacuum circuit-breakers (VCB) with long distance gaps, the maximum possible improvement factor K of breakdown voltage of VCBs with double breaks or multiple breaks in high voltage power system is theoretically deduced. Applying the concept of breakdown weak points and probabilistic method, the statistical distribution models of static breakdown for VCBs with double breaks or multiple breaks is established. The authors think that whether for VCB with double breaks or that with multiple breaks connected in series the statistical probability of breakdown is lower than that of single break. The experimental model with single break and that with triple breaks are built up respectively, and a lot of impulse breakdown tests for vacuum extinction chamber model with single break and VCB model with triple break are conducted. The research results show that the breakdown probability of vacuum extinction chamber with triple breaks is lower than that of vacuum extinction chamber model with single break, the testing data basically coincides with theoretical distribution curve.
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