Study on solar energy wafer counting based on morphology processing

FANG Chao,TAN Wei,DU Jianhong

2011-01-01

Abstract:This article presents an automatic counting method using digital image processing to solve difficulties in manual Solar Energy Wafer(SEW) counting in the industry.By analyzing the texture,a morphology processing counting method is proposed.Experimental result shows that the algorithm is simple and feasible.

What problem does this paper attempt to address?

Solar Energy Wafer Counting Based on Textural Property

FANG Chao,TAN Wei,DU Jian-hong

DOI: https://doi.org/10.3969/j.issn.1672-2892.2011.02.012

2011-01-01

Abstract:This article presents an automatic counting method using digital image processing to solve difficulties in manual Solar Energy Wafer(SEW) counting in industry production.By analyzing the image texture of overlaid wafers,the author firstly locates wafer area employing first-order statistics method and edge detection projection,and then performs counting by extremum analysis in this practical application.The experiment results show that the algorithm is highly accurate with the locating accuracy up to 94% and the counting accuracy up to 95%,and it is convenient and applicable.
Study and Application of Automatic Count System Based on Computer Vision Detect Technology

LUO Zhi-jian,ZHANG Hong-jian,QI Sui-ping,ZHOU Hong-liang

DOI: https://doi.org/10.3969/j.issn.1002-1841.2005.03.009

2005-01-01

Abstract:In order to automatically count the whorl steel in the product-line,an automatic detect system based on the computer vision was presented.The system uses CCD camera to capture on-line and real-time image,the information including the edges,the value of gray degree and the distribution of gray gradient obtained respectively from the image,have been fused to get more accurate result.The result was combined with the threshold value multi-segmented to achieve the goal of automatic count.Actual application results show that the method possesses high precision.
Studies on Image Stitching Algorithms in Machine Vision Inspection of Solar Panel

Yongjian Zhu,GuangWen Qi

DOI: https://doi.org/10.1109/icseng.2018.8638240

2018-01-01

Abstract:Image stitching is an important technology in machine vision inspection whose algorithms focus on the detection and match of feature points. For the solar panel images achieved by machine vision, it's found that the available image stitching algorithms failed to detect enough valid feature points, which led to a large number of incorrect matching points. Here, we improve an algorithm to locate feature points and find dense match points. The proposed algorithm is based on SIFT. The improved algorithm (I-SIFT) can locate the position of feature points in every solar panel images, reducing the effect of invalid feature points on the experiment. Euclidean distance is used to preliminarily ensure the matching points, and then the relative horizontal position of every matching points is used to eliminate the mismatching points caused by the space similarity of the feature points, so that the matching accuracy is improved. Then the improved algorithm is used in the traditional Harris, SIFT and SURF stitching algorithm. The experimental results show that the success rate of I-SIFT algorithm can exceed 95% and the computation time has decreased by nearly 95% than that of the traditional algorithm. In conclusion, the improved algorithm implements accurately and rapidly stitching for solar panel images.
Method of In-Process Measurement of Wafer Surface Quality Based on Laser Scattering Principle

张楠,陶正苏,郭瑞鹏

DOI: https://doi.org/10.3969/j.issn.1000-9787.2009.07.034

2009-01-01

Abstract:As the basic material of IC chips,the surface quality of wafer plays an important role in the machining process of IC chips.The surface roughness parameter(Ra,i.e.the arithmetic average height parameter)is chose to evaluate the surface quality of wafer.According to the surface roughness range of silicon wafer(Ra=0.01~0.8 μm),an optical measurement based on the light scattering principle is established,which is founded on a machine vision system.By analyzing the images of the spatial distribution of the scattered light intensity,some parameters are selected to estimate Ra.Elementary experiment results are shown and the feasibility of this method is demonstrated.
Precision Cutting Technology of Solar Wafer and Characteristic Research

Feng LIN,Jian-ping WANG,Jian-zhong FU

DOI: https://doi.org/10.3969/j.issn.1003-5451.2010.01.004

2010-01-01

Abstract:On the basis of the current solar wafer cutting technology and its characteristics,the numerical control ultrasonic vibration cutting solar wafer technology was presented to provide a practical method of processing for the precision cutting of solar wafer.
Automated visual inspection of solar cell images using adapted morphological and edge detection algorithms

Maoqing Cao,Long Ma,Riqiang Li

DOI: https://doi.org/10.1007/s12596-023-01284-w

2023-07-14

Journal of Optics (India)

Abstract:The surface of solar cell products is critically sensitive to existing defects, leading to the loss of efficiency. Finding any defects in the solar cell is a significantly important task in the quality control process. Automated visual inspection systems are widely used for defect detection and reject faulty products. Numerous methods are proposed to deal with defect detection and solar cell inspection. However, they suffer from high computation complexity and hardware requirement cost issues. To overcome these issues, in this study, an effective visual inspection method is proposed to detect different types of defects in solar cells. The proposed method is based on adapted morphological and edge detection algorithms. This method uses multiple uses of morphological and canny edge detection with adapted parameters to extract and highlight the objects on a solar cell. Then the detected objects are classified, and different defect types and components are detected using their features and classification algorithm. Experimental results indicate that the proposed method can meet the requirements for effectiveness and real-time processing and presents promising results compared to other existing algorithms.
Two-stage Infrared Images Photovoltaic Panel Extraction Based on Deep Semantic Segmentation.

Lingxia Lu,Ruide Li,Donglian Qi

DOI: https://doi.org/10.1145/3497623.3497636

2021-01-01

Abstract:Abstract: In order to improve the efficiency of photovoltaic (PV) power maintenance, it is necessary to regularly monitor the panels by infrared image defect detection within the plants. However, the complexity of background in infrared image is significant effect the accuracy and precision of defect detection. Thus, PV string segmentation and panel extraction are necessary and time-consuming before defect detection. In this paper, we propose an automatic PV panel area extraction algorithm for infrared images. First, image preprocessing is performed for transforming original infrared image into gray-version and denoising. Then, we apply deep semantic segmentation to segment PV string automatically, followed by PV panel extraction based on an edge extraction with vertical and horizontal direction, and morphological processing. The accuracy of the results is evaluated by fusion image visually and quantitatively by a mean completeness of 98.60%, a mean correctness of 91.53%, and a mean quality of 90.40%, are obtained with the proposed method.
The Acoustic Micro Integrated Detection Technique for Silicon Wafer Processing

Sun An-yu,Ju Bing-feng

DOI: https://doi.org/10.4028/www.scientific.net/amr.497.151

2012-01-01

Advanced Materials Research

Abstract:This document presents an integrated detection method for the whole cycle of silicon wafer processing based on Scanning Acoustic Microscope (SAM). It can be used for thickness and chamfering measurement, surface and subsurface testing, internal defects detection and identification. A SAM system was designed for silicon processing and silicon-based devices fabrication. It has more favorable measuring accuracy and quantitative analysis ability than the traditional inspection equipments using for wafer process such as infrared detector.
Measurement of the Characteristics of Pulp Fibers Based on Computer Vision

HOU Bei-ping,LI Ping,SONG Zhi-huan

DOI: https://doi.org/10.3321/j.issn:1000-6842.2005.01.047

2005-01-01

Abstract:An on-line measurement device of pulp fiber based on computer vision is designed according to the characteristics of pulp fiber. The image-processing algorithm is proposed to extract the characteristics of the fiber, which can be obtained after fiber image denoising, image enhancement and corner detection. In the paper, the fiber length, coarseness, curl degree and distribution are used to describe the fiber characteristics. The corner detection algorithm is applied to identify the curl characteristics of the fiber. Experimental results proves the validity and effectiveness of this method.
Polycrystalline Silicon Wafer Surface Color Defect Inspection Based on Machine Vision

Han Wang,Rui Miao,Xiao Song Wu,Wang Yuan Ni,Xu Chen Tang

DOI: https://doi.org/10.4028/www.scientific.net/amm.548-549.48

2014-04-01

Applied Mechanics and Materials

Abstract:As non-uniform color and complex texture exist on the polycrystalline silicon solar cell, manual surface inspection adopted by most domestic factories suffers from low efficiency and poor repetitive detection ability. To overcome the shortcomings of manual inspection, based on machine vision and SVM, an automatic silicon wafer surface defect detection and classification system has been developed in this paper: through feature extraction of color images and defect areas, a series of wafer classifiers are trained and used to separate the defective products from qualified ones. Experiments on samples and actual application in the enterprise show that the system has achieved high accuracy and fast run-time performance, indicating that machine vision is an effective and promising method for polycrystalline silicon solar cell inspection.
Automatic Morphological Extraction of Fibers from SEM Images for Quality Control of Short Fiber-Reinforced Composites Manufacturing

Md. Fashiar Rahman,Jianguo Wu,Tzu Liang (Bill) Tseng

DOI: https://doi.org/10.1016/j.cirpj.2021.03.010

2018-01-01

Abstract:The morphology of fibers (e.g., spatial uniformity and orientation) plays a decisive role in determining the material properties or fabrication quality of fiber-reinforced nanocomposites. The existing literature lacks a reliable and automatic fiber extraction method for morphology analysis based on the scanning electron microscope (SEM) images. This paper proposes four different methods, namely, the simple Hough Transform, opening method, partitioning Hough Transform and gradient based Hough Transform, to automatically identify the fibers from SEM images to expedite the morphology analysis. The performance of these methods are thoroughly evaluated and compared through simulation studies and real case studies.
A Method of Automatic Cell Counting Based on Microscopic Image

Xiaomin Guo,Feihong Yu

DOI: https://doi.org/10.1109/IHMSC.2013.76

2013-01-01

Abstract:This paper introduces an efficient automatic cell counter based on microscopic image. The counter separates the cell and background by histogram dual-threshold, fills the cell by Floodfill, and detects the cell using blob analysis. Then, using K-means clustering method segments the adherent cells. The highlight advantage of our proposed method is that it has good adaptability for different kinds of cells and strong robustness to light intensity. Experimental results show that the counter can quickly and correctly detect the number of cells and have good stability, regardless of the cell morphology, cell type and cell size. The method has been successfully applied to the microscopic image processing system.
Research on detection method of photovoltaic cell surface dirt based on image processing technology

Xiang Hu,Zhong Du,Fuwang Wang

DOI: https://doi.org/10.1038/s41598-024-68052-z

IF: 4.6

2024-07-24

Scientific Reports

Abstract:In view of the reduced power generation efficiency caused by ash or dirt on the surface of photovoltaic panels, and the problems of heavy workload and low efficiency faced by manual detection, this study proposes a method to detect dust or dust on the surface of photovoltaic cells with the help of image processing technology to timely eliminate hidden dangers and improve power generation efficiency.This paper introduces image processing methods based on mathematical morphology, such as image enhancement, image sharpening, image filtering and image closing operation, which makes the image better highlight the target to be recognized. At the same time, it also solves the problem of uneven image binarization caused by uneven illumination in the process of image acquisition. By using the image histogram equalization, the gray level concentration area of the original image is opened or the gray level is evenly distributed, so that the dynamic range of the pixel gray level is increased, so that the image contrast or contrast is increased, the image details are clear, to achieve the purpose of enhancement. When identifying the target area, the method of calculating the proportion of the dirt area to the whole image area is adopted, and the ratio exceeding a certain threshold is judged as a fault. In addition, the improved A* path planning algorithm is adopted in this study, which greatly improves the efficiency of the unmanned aerial vehicle detection of photovoltaic cell dirt, saves time and resources, reduces operation and maintenance costs, and improves the operation and maintenance level of photovoltaic units.

multidisciplinary sciences
Surface defect detection of solar cells based on Fourier single-pixel imaging for removal of substrates interference

Jun Ma,Xicheng Gao,Jiaqi Wang,Qingtian Guan,Huaxia Deng,Xinglong Gong,Mengchao Ma,Xiang Zhong

DOI: https://doi.org/10.1016/j.optlaseng.2024.108073

IF: 5.666

2024-02-04

Optics and Lasers in Engineering

Abstract:The solar cell is key photovoltaic (PV) device that converts light energy into electricity, and its surface defects are the main reason for the decrease in the efficiency of PV systems. Conventional solar cell defect detection methods are often interfered with by cell substrates and are difficult to detect under high reflection, especially the overlap of substrates and defects. A solar cell defect detection method based on Fourier single-pixel imaging (FSI) is proposed to distinguish periodic substrates and defects in reconstruction by projecting illumination patterns with Fourier fringes, in which the removal of substrates reaches 100%. Meanwhile, for the high reflection present on the solar cell surface, the solar cell is directly treated as a single-pixel detector, which is free from interference from ambient light. The experiment adopts the solar cell itself as an imaging device under highly reflective conditions and removes the interference of the cell substrate by a 4-step phase-shifted FSI reconstruction algorithm to achieve the extraction of four types of defects, each of which is located in a different position of the solar cell substrate, at 10%, 50%, and 100% sampling rates. The method described here complements existing solar cell defect detection approaches and may be applied to enhance photovoltaic testers that rely on real-time correlation measurements, with promising applications in chip inspection and medical cell imaging.

optics
A Count Measurement Method for Low Contrast Stacked Sheets in Machine Vision

Changyan XIAO,Hualin QIU,Hong ZHAO,San CAO,Shilong JIANG

DOI: https://doi.org/10.16339/j.cnki.hdxbzkb.2018.04.016

2018-01-01

Abstract:To solve the problem of sheets counting in the printing industry and so on,the count meas-urement method based on machine vision is proposed.Image acquisition system is built by using the latest high-resolution CMOS camera and megapixel,low distortion of the fixed focus lens.Aiming at the prob-lem of detecting low contrast stacked sheets,a local histogram equalization algorithm and a linear enhance-ment based on bi-Gaussian second order are proposed.The algorithm is divided into the following parts. First,to improve the speed of the algorithm,only part of the image,which is obtained from image acquisi-tion platform,is selected as processing area,and wavelet de-noising is performed.Second,the prepro-cessed image is enhanced by the local histogram equalization.Then,the detecting of the stacked sheets is acquired by using second-order derivative of bi-Gaussian and mean filter processing in the horizontal and vertical directions,respectively.Finally,the counting result can be acquired by the peak detection,and displayed in time.Experimental results show that the error rate of the count measurement method is less than 0.01% for the various types of sheets (including the 0.05 mm pure white sheets).It can also save a lot of manpower and material sources.Therefore,it deserves being promoted and used.
A Condition Change Detection Method for Solar Conversion Efficiency in Solar Cell Manufacturing Processes

Juan Du,Xi Zhang,Jianjun Shi

DOI: https://doi.org/10.1109/tsm.2018.2875011

IF: 2.7

2018-01-01

IEEE Transactions on Semiconductor Manufacturing

Abstract:A solar cell manufacturing process typically has multiple, serial fabrication stages. In general, there are limited quality inspection and control points along the multiple fabrication stages, resulting in inconsistent product quality at the final stage. The existing studies on solar cell manufacturing focus on offline quality monitoring after completion of all manufacturing stages. Thus, an effective in-process method of detecting changes in key stages in terms of product quality is necessary to mitigate the effect of the quality fluctuation. This paper proposes an in-process method of detecting the process changes in terms of product quality by studying multichannel sensing signals collected in the epitaxy stage. This stage is an important stage of material layer formation and considerably influences the solar conversion efficiency of the final product. Interpretable geometric features are obtained by considering the process knowledge for each channel of sensing data. A decision-level data fusion method is further proposed to integrate the changes detected from each sensing signal. The proposed method is demonstrated via a real case from solar cell manufacturing processes.
APPLYING LOCAL REGION DESCRIPTORS AND SOM CLUSTERING ALGORITHM IN LED DIE COUNTING

Tang Liang,Liu Ye,Chen Yanqiu

DOI: https://doi.org/10.3969/j.issn.1000-386X.2012.10.006

2012-01-01

Abstract:Traditional image processing algorithms tend to be affected by light interference,angle variation,noise and other factors,making it impossible to get identification results accurately and quickly.This paper presents a novel local region descriptor to describe the gray value feature of the target point group.When combined with self organising map(SOM) clustering,it is able to identify the die area in light-emitting diode(LED) efficiently and to calculate the die number accurately.Experimental results show that this algorithm is capable of counting the LED die number efficiently with higher accuracy and better robustness.
An Automatic Condition Detection Approach for Quality Assurance in Solar Cell Manufacturing Processes

Juan Du,Xi Zhang,Qingpei Hu

DOI: https://doi.org/10.1109/lra.2017.2708126

IF: 5.2

2017-01-01

IEEE Robotics and Automation Letters

Abstract:Solar conversion efficiency is one of the most important quality metrics in solar cell production. During the production process, many operating factors might potentially influence the process conditions, thereby leading to unstable solar conversion efficiency of solar cell products. However, most solar cell fabrication plants focus more on inspections of the solar conversion efficiency after the growth of semiconductor epitaxy layers and electrodes because of a lack of an efficient strategy for online detection of process condition changes. This study develops an automatic approach for change condition detection in the multistage solar cell manufacturing process. By fully analyzing the geometrical features of the multichannel epitaxy data, process condition information can be obtained from temperature and reflectance profiles during the epitaxy layer growth. A likelihood ratio test is used to address the extracted features for in-advance change detection in solar conversion efficiency at the semiconductor epitaxy layer growth stage, thereby facilitating timely process adjustment and remedies. A real case from a multistage solar cell manufacturing process is used to validate the proposed method.
Micro-crack Detection of Polycrystalline Silicon Solar Wafer

Zeinab Mahdavipour,Mohd Zaid Abdullah

DOI: https://doi.org/10.1080/02564602.2015.1028484

2015-04-13

IETE Technical Review

Abstract:This paper proposes a machine vision scheme for detecting micro-crack defects in polycrystalline solar wafer manufacturing. Micro-crack inspection is very challenging because this type of defect is very small and completely invisible to naked eyes. The presence of other heterogeneous structures in solar wafer like grainy materials and dark regions further complicates the problem. In this paper, an efficient micro-crack inspector comprising of near infrared illumination and improved Niblack segmentation algorithm is proposed. Empirical and visual results demonstrate that the proposed solution is competitive when compared to the existing Niblack thresholding formulas and achieve better precision and performance in terms of Pratt's figure of merit.

telecommunications,engineering, electrical & electronic
A Method for Automatic Counting and Labeling of Cells Stained with Microporous Membrane

Jiangcheng Cao,Tingting Hun,Wenbo Zhou,Zheng Liu,Wei Wang,Yufeng Jin

DOI: https://doi.org/10.1109/NEMS51815.2021.9451488

2021-01-01

Abstract:Cells in the blood can be screened through a membrane. But the method of manually identifying the number of cells is time-consuming and laborious, and there may even he some errors. Therefore, an effective image recognition method was adopted in this paper to automatic count and label the stained cells on the membrane after filtration. We tested the images of cells without the influence of the membrane, and compared them with the actual number of cells with 90% accuracy. Under the influence of the filter membrane, the accuracy is about 80%. Therefore, this method can be used to calculate the number of cells in the images relatively accurately and efficiently.

Study on solar energy wafer counting based on morphology processing

Solar Energy Wafer Counting Based on Textural Property

Study and Application of Automatic Count System Based on Computer Vision Detect Technology

Studies on Image Stitching Algorithms in Machine Vision Inspection of Solar Panel

Method of In-Process Measurement of Wafer Surface Quality Based on Laser Scattering Principle

Precision Cutting Technology of Solar Wafer and Characteristic Research

Automated visual inspection of solar cell images using adapted morphological and edge detection algorithms

Two-stage Infrared Images Photovoltaic Panel Extraction Based on Deep Semantic Segmentation.

The Acoustic Micro Integrated Detection Technique for Silicon Wafer Processing

Measurement of the Characteristics of Pulp Fibers Based on Computer Vision

Polycrystalline Silicon Wafer Surface Color Defect Inspection Based on Machine Vision

Automatic Morphological Extraction of Fibers from SEM Images for Quality Control of Short Fiber-Reinforced Composites Manufacturing

A Method of Automatic Cell Counting Based on Microscopic Image

Research on detection method of photovoltaic cell surface dirt based on image processing technology

Surface defect detection of solar cells based on Fourier single-pixel imaging for removal of substrates interference

A Count Measurement Method for Low Contrast Stacked Sheets in Machine Vision

A Condition Change Detection Method for Solar Conversion Efficiency in Solar Cell Manufacturing Processes

APPLYING LOCAL REGION DESCRIPTORS AND SOM CLUSTERING ALGORITHM IN LED DIE COUNTING

An Automatic Condition Detection Approach for Quality Assurance in Solar Cell Manufacturing Processes

Micro-crack Detection of Polycrystalline Silicon Solar Wafer

A Method for Automatic Counting and Labeling of Cells Stained with Microporous Membrane