Development of Displacement Measurement Technologies Based on Grating Interferometry

王国超,颜树华,高雷,谢学东,田震
DOI: https://doi.org/10.3969/j.issn.1001-3806.2010.05.023
2010-01-01
Abstract:Methods of displacement measurement based on grating intefferometry,including classical dual-grating measurement systems,nonsymmetrical doubly blazed reference grating measurement systems,single grating measurement systems,grating measurement systems based on the 2nd harmonic Moire fringes,concentric-circle grating two-dimension displacement measurement systems,and the two-dimension grating measurement systems,were introduced.The key problems and disadvantages of each system were presented as well.According to dual-frequency laser interferometer,the dual-wavelength single grating nanometer displacement measurement was put forth based on the single grating measurement system.After analyzing its characteristics,it was pointed out that it could realize the measurement with a wide range,nanometer precision and nanometer resolution.After a general comparison among these methods,a conclusion of key technologies was drawn,and an outlook of displacement measurement based on grating interferometry was presented.
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