Technical Reform of Wavefront Digitization of Ф300 Mm Large-aperture Flat Equal Thickness Interferometer

Qing WANG,Zhishan GAO,Zhixin LI,Yongning ZHANG,Dongsheng ZHAO,Zhong HU,Yue HE
DOI: https://doi.org/10.3969/j.issn.1674-5795.2011.05.005
2011-01-01
Abstract:The reform of a Ф300 mm large-aperture flat equal thickness interferometer to a phase-shifting digital plam interferenter is introduced.After reform the instrument adopt the liquid basis to calibrate systematic error.The maximum permissible error at Ф300 mm aperture is 76 nm(PV value),and the repeatability of measurement is 4 nm,The related usage requests are satisfied.
What problem does this paper attempt to address?