Abstract:Secondary ion mass spectrometry(SIMS) is more sensitive than other surface microregion analysis instrumentals. Because the neutral atom, liquid metal ion and laser primary beam, the post ionization, the time of flight analyzer with retarding electrode, the ion delay detection and the computarizing image technique have been used in SIMS, it has the following feature parameters: the energy and spot of primary beam is up to MeV and down to less μm, the mass resolution is up to 15 000, the lateral and depth resolution come to less 0.5 μm and 5 nm, the detection limit is down to ng/g, and the other fearure is to giving two or three dimensional image. SIMS can be used to detect the half quatitative element concentration and isotope abundance in the mineral, nucleomatter, meteorite and cosmomatter, to identify the high volatile and thermal instable biomacromolecule, to analyze the lateral and depth profile to giving ion image information. The applicable region of SIMS has been extended to measuring of the single particulate matter, cluster, polymer, microelectronic crystal piece, isotope label compound in the biological cell, microchip, single nucleotide polymorphisms (SNP) genotyping, ect,. The quasimolecular ion peak of deoxyribonucleic acid (DNA) contained twenty hundred base pairs was observed by MALDI TOFMS. The main achievements are summarized and several key applications are illustrated in great detail.

Development of Secondary Ion Mass Spectrometry

Development of Microwave Plasma Torch Mass Quadrupole Spectrometer

Development the Miniaturized AMS System and Its Analysis Technique

Developments In Accelerator Mass Spectrometry (Ams) Method For Hf-182

Recent Developments on Secondary Ion Mass Spectrometry

Two Types of Ion Gun Equipped Sputter-Initiated Resonant Ionization and Time-Of-Flight Mass Spectroscopy and Its Application in Microanalysis of Minerals

Development of High Throughput Microscope Mode Secondary Ion Mass Spectrometry Imaging

Recent Progress of Nuclear Technological Application for Inductively Coupled Plasma Mass Spectrometry(ICP-MS), Thermal Ionization Mass Spectrometry(TIMS) and Secondary Ion Mass Spectrometry(SIMS)

Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter

Component Distribution of Nano-Carbon Materials Assisted by Time of Flight-Secondary Ion Mass Spectrometer

Time-of-flight Secondary Ion Mass Spectrometry and Its Applications in Secondary Batteries

Pore confined time-of-flight secondary ion electrochemical mass spectrometry

Development of High Acquisition Speed Time-of-Flight Mass Spectrometer for Combination with Comprehensive Two-dimensional Gas Chromatography

New Developments and Applications in Time-Of-Flight Mass Spectrometer

DEVELOPMENT OF A SIRI TOFMS AND THE APPLICATION RESEARCH PROGRESS

Advances In Nanomaterials Facilitated Mass Spectrometry Imaging

A Linear Time-of-flight Mass Spectrometer with Relatively High Resolution for Diagnostic of High Energy Ion Beam

Development of Orthogonal Acceleration Time-of-Flight Mass Spectrometer for Detection of Ions with Wide Energies Distribution

Development of a Newly Compact Double-Focusing Mass Spectrometer

Development And Performance Of A Miniature Vacuum Ultraviolet Ionization/Orthogonal Acceleration Time Of Flight Mass Spectrometer

Development of an energy-sensitive detector for the Atom Probe Tomography