The Diffusion Of Metal In Polymer-Films

Ji-Zhong Zhang,SY Lin,Wei-Kan Chu,RP Kusy,JQ Whitley
DOI: https://doi.org/10.1016/0042-207X(89)90182-6
IF: 4
1989-01-01
Vacuum
Abstract:Both the Rutherford backscattering spectrometry (RBS) and the secondary ion mass spectrometry (SIMS) techniques have been employed in studying the diffusion of metal atoms in a polymer film. Au,Ag and Cu films of uniform 90–110 Å thickness were evaporated on polymethyl methacrylates (PMMA) and lucite. Radiation damage on lucite was limited by scanning a 1.25 MeV He ion beam in a large circular pattern on a lucite disk. The Au diffusion tail was clearly visible in the RBS spectrum. The solubility of Au in lucite has been estimated at 90°C annealing for 48 h. The SIMS profile of 100 Å Au film on the high molecular weight PMMA is consistent with the RBS result for lucite.
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