Analysis of Laser Intensification by Nodular Defects in Mid-Infrared High Reflectance Coatings

Ying Wang,Yueguang Zhang,Xu Liu,Weilan Chen,Peifu Gu
DOI: https://doi.org/10.1016/j.optcom.2007.06.046
IF: 2.4
2007-01-01
Optics Communications
Abstract:Electric field modeling of nodular defects is performed to investigate the interaction between defective multilayer coatings and Gaussian profile laser beam. Light intensity is significantly enhanced as large as 6 times within the nodular defects. Different geometries of defects irradiated by laser beams at 0 to 40 deg incident laser angles are analyzed. Nodules with large but shallow seeds, or irradiation of 40 deg p-polarized laser beam, tends to produce the greatest enhancement effect.
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