Application of Atomic Force Microscope on Self-assembly Study

PAN Bing,DONG Shen,YAN Yong-da,ZHAO Jian-Wei
DOI: https://doi.org/10.3969/j.issn.1002-2333.2006.05.041
2006-01-01
Abstract:Recently, Atomic force microscope (AFM) has become a powerful technique in self-assembly field owing to its many advantages. In this mini-review, its application in self-assembly study is given briefly such as the characterization of the surface morphology and properties, fabricating nanometer scale structure, and the investigation of self-assembly on nanometer scale, which is based on the introduction of the superiority of AFM as well as self-assembly.
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