Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi2Ta2O9 Capacitors

Dan Xie,Zhigang Zhang,Tianling Ren,Litian Liu
DOI: https://doi.org/10.1143/jjap.45.9143
IF: 1.5
2006-01-01
Japanese Journal of Applied Physics
Abstract:Pt/SrBi2Ta2O9 (SBT)/Pt capacitors have been successfully fabricated using a metalorganic decomposition (MOD) technique. The switchable polarization of SBT capacitors showed a tendency to increase with the number of switching cycles at first and then decrease after 2×109 switching cycles. During the switching process, a competition existed between the depinning behavior of domains and the aggregation of defect charges at the interfaces between SBT thin films and electrodes. It was this competition that determined the fatigue characterization for SBT capacitors. Higher external voltages facilitated the recovery of polarization suppression, which suggests that more domains in the SBT thin films were easily depinned by a higher external field and the pinning depth due to defect charges was different.
What problem does this paper attempt to address?